Inspection system with material identification

ABSTRACT

An angular analysis system that can be controlled to receive radiation at a defined angle from a defined focus region. The angular analysis system is used for level 2 inspection in an explosive detection system. Level 2 inspection is provided by a three-dimensional inspection system that identifies suspicious regions of items under inspection. The angular analysis system is focused to gather radiation scattered at defined angles from the suspicious regions. Focusing may be achieved in multiple dimensions by movement of source and detector assemblies in a plane parallel to a plane holding the item under inspection. Focusing is achieved by independent motion of the source and detector assemblies. This focusing arrangement provides a compact device, providing simple, low cost and accurate operation.

RELATED APPLICATIONS

This application claims priority under 35 U.S.C. § 119(e) to U.S.Provisional Application Ser. No. 60/690,281, entitled “MOVING SOURCE ANDDETECTOR COLLIMATION AND TARGETING INSPECTION SYSTEM FOR MATERIALIDENTIFICATION BY ENERGY-DISPERSIVE COHERENT X-RAY SCATTERING ORFLUORESCENT EMMISSIONS,” filed on Jun. 14, 2005, which is hereinincorporated by reference in its entirety.

This application claims priority under 35 U.S.C. § 119(e) to U.S.Provisional Application Ser. No. 60/690,440, entitled “COHERENT X-RAYSCATTERING SYSTEM WITH EXTERNAL POWER SUPPLY,” filed on Jun. 14, 2005,which is herein incorporated by reference in its entirety.

BACKGROUND OF INVENTION

1. Field of Invention

This application relates generally to material identification and morespecifically to inspection systems that perform material identification.

2. Discussion of Related Art

Inspection systems are widely used to obtain information on objects thatcannot be readily seen in an external examination of items underinspection. Inspection systems are used as part of security systems,such as explosive detection systems, used at airports or other settingsto preclude people from smuggling explosives into a secure area byconcealing them in packages. Though, inspection systems may also be usedduring mail processing to obtain information on objects in packages,during mail processing on bones or other structures inside a human bodyduring medical testing, on objects in food products as part of healthinspections, on minerals in ore as part of a mining operation and inmany other settings.

Frequently, inspection systems use penetrating radiation, such asx-rays. The inspection system captures the radiation after it hasinteracted with an item under inspection. Analysis of the radiationreveals properties of objects inside the item under inspection. Based onthis analysis, a security system can “clear” an item by determining thatit contains only innocuous objects or can “alarm” an object bydetermining that it likely contains one or more objects that pose athreat. Other inspection systems may cause other actions based on theproperties of the objects identified in the inspection.

In capturing radiation, some inspection systems discriminate betweenradiation emanating from an object at different angles. Angulardiscrimination may be used in conjunction with a focusing system thatpasses only radiation from a specific region on which data is to becollected. In some instances, controlling the measurement angle revealsinformation useful for analyzing an object. For example, the angle atwhich radiation scatters from an object is an indication of the type ofmaterial that makes up the object. As one example, x-ray diffractionanalysis may be used to analyze the spectrum of radiation scattered froma region of an item under inspection to determine whether that regioncontains innocuous material or a threat material.

SUMMARY OF INVENTION

In one aspect, the invention relates to an inspection system that has aconveyor adapted to move items in a first direction. The system has asource assembly with an x-ray source adapted to irradiate an item on theconveyor and a source collimator positioned between the x-ray source andthe conveyor. A first positioning mechanism is adapted and arranged tomove the source assembly in a second direction, transverse to the firstdirection. The system also has a detector assembly with a detector and adetector collimator positioned between the detector and the conveyor. Asecond positioning mechanism is adapted and arranged to move thedetector assembly in the second direction. The second positioningmechanism can be controlled in at least one direction independently ofthe first positioning mechanism.

In another aspect, the invention relates to a method of operating aninspection system having a source, a detector and an inspection regionadapted and arranged to position an item under inspection in a plane.According to the method, the source and the detector move parallel tothe plane to create a focus region in an item under inspection. Thesource radiates the focus region and the detector measures radiationemanating at an angle from the focus region. The measured radiation isthen analyzed.

In another aspect, the invention relates to a method of operating aninspection system. The method includes moving an item through aninspection area; and gathering data on a focus region of the item usinga source and a detector while moving the source and the detectorsynchronously with the item.

BRIEF DESCRIPTION OF DRAWINGS

The accompanying drawings are not intended to be drawn to scale. In thedrawings, each identical or nearly identical component that isillustrated in various figures is represented by a like numeral. Forpurposes of clarity, not every component may be labeled in everydrawing. In the drawings:

FIG. 1 is sketch of an explosive detection system in which an embodimentof the invention may be employed;

FIG. 2 is a block diagram of an inspection system according to anembodiment of the invention;

FIG. 3 is a sketch of a helical scan CT system, which may be used as thethree-dimensional imaging system in the inspection system of FIG. 2;

FIG. 4 is a side view of an X-ray diffraction system, which may be usedas the angular analysis system in the inspection system of FIG. 2;

FIG. 5 is a sketch useful in understanding adjustment of the X-raydiffraction system of FIG. 4;

FIG. 6A is a top view of an aperture plate of the X-ray diffractionsystem of FIG. 4;

FIG. 6B is a side view of the aperture plate of FIG. 6A;

FIG. 7A is a sketch of an energy spectrum measured at a first angle withthe X-ray diffraction system of FIG. 4;

FIG. 7B is a sketch of an energy spectrum measured at a second anglewith the X-ray diffraction system of FIG. 4; and

FIG. 8 is a flow chart illustrating operation of the X-ray diffractionsystem of FIG. 4.

DETAILED DESCRIPTION

The inventors have appreciated that an improved inspection system may beformed with improved material identification capabilities. Theimprovements may be in the size, speed, cost or accuracy of the system.

In some embodiments, the improved inspection system uses an angularanalysis system that selectively measures radiation at a specifiedangle. In one aspect, an improved angular analysis system may resultfrom independently positionable source and detector assemblies thatallow the angular analysis system to be focused on a region of an itemunder inspection by relative motion of the source and detectorassemblies parallel to a plane holding an item under inspection. Thisconfiguration allows the angular analysis system to have a relativelysmall size and enables it to be practically used in environments wherespace is constrained. For example, such a system may be used in abaggage inspection system at an airport. It may be installed in anexisting inspection bag room or as part of an in-line conveyor systemwithout removing walls, raising ceilings or otherwise making extensivephysical modifications to airport buildings.

In another aspect, speed of inspection may be improved by synchronizingmotion of the source and detector assembly with motion of an item underinspection while a measurement is made. Because a conveyor carrying theitems does not need to stop and restart for each item to be inspected,the inspection system may have a higher throughput. Items to beinspected can be continuously inspected at a rate matching the rate atwhich suspicious objects are identified by a first level inspectionsystem.

In another aspect, the speed of the angular analysis system may beincreased by providing a collimator configuration that increases theamount of radiation reaching the detector without unreasonablydecreasing the angular resolution of the system. Such a system reducesthe time required to acquire data with a signal to noise ratio adequatefor an accurate determination of material properties.

These aspects may also reduce system cost. For example, providing asimple mechanism to an angular analysis system on suspicious regions ofan item under inspection may reduce the overall cost of the system.

Costs may also be reduced in other ways. In another aspect, the angularanalysis system can be simply reconfigured to selectively measureradiation emanating at different angles from a region of an item underinspection. The same detector can be used to measure radiation atmultiple angles, reducing the overall cost of the system.

Aspects of the angular analysis system may also increase the accuracy ofthe system. Facilitating measurements of radiation emanating atdifferent angles may increase the accuracy of the system by allowing amaterial to be analyzed based on radiation emanated at an angle thatreveals the most useful information for analysis. In addition, the smallsize of such a system allows it to be readily used in conjunction withsystems employing other inspection technologies. Using such systemstogether may significantly improve the accuracy with which the overallinspection system operates.

These and other aspects of an inspection system are described belowusing an explosive detection system as an example. Such a system, forexample, may be used at an airport to inspect checked luggage, carryonbaggage or other similar items. However, the invention is not limited tothis example embodiment.

FIG. 1 illustrates an explosive detection system 110 according to anembodiment of the invention. Explosive detection system 110 includes amechanism to move items under inspection through the system. In thisexample, conveyor 112 moves item under inspection 180.

Conveyor 112 runs through a tunnel 114. Tunnel 114 is formed from ahousing or other suitable structure. As will be described in more detailbelow, explosive detection system 110 includes equipment within tunnel114 that irradiates an item under inspection with x-rays and measuresradiation that has interacted with the item under inspection. Thesemeasurements are used to aide a determination of whether the item underinspection contains an explosive.

Though a single housing is shown in FIG. 1, in some embodiments, theequipment may be positioned in multiple housings. Those housings may becoupled in any suitable way, such as by a conveyor system. Moreover, thehousing may be in any desired form and may be omitted in someembodiments.

Explosives are one example of the types of objects that an inspectionsystem may detect and the invention is not limited to use in conjunctionwith systems that detect explosives. More generally, an inspectionsystem used as part of a security system may screen items underinspection and indicate whether each item may contain detect drugs,illicit currency, weapons or other contraband items. Though, theinvention is not limited to use in conjunction with such securitysystems. It may be used in conjunction with any type of system thatdetermines material properties, such as systems that detect valuablematerials in mining or recycling operations.

In the example of FIG. 1, item under inspection 180 is illustrated as asuitcase with an object inside of it forming a suspicious region 182.Explosive detection system 110 operates to determine, with a high degreeof accuracy, whether suspicious region 182 is formed by an explosivematerial inside item under inspection 180. The overall output ofexplosive detection system 110 is an indication that item underinspection 180 either contains no explosives and is “clear” or possiblycontains an explosive and requires an “alarm.”

As shown, the output of explosive detection system 110 is provided at anoperator review station 170. A human operator monitoring operator reviewstation 170 may make a determination of the appropriate processingrequired for an item under inspection based on the output of explosivedetection system 110. That output instead or additionally may beprocessed by one or more computers as part of making a determination ofwhether an item under inspection is clear or is alarmed.

In the described embodiment, explosive detection system 110 includes twostages. A different inspection technology is used at each stage to makean overall determination that item under inspection 180 either is“clear” or requires an “alarm.” One stage performs a first levelinspection, which, for each item under inspection, indicates that theitem is clear or that it contains a suspicious region. Those itemscontaining suspicious regions are then transferred to the second levelof inspection for a more accurate determination of whether the item isclear or requires an alarm.

FIG. 2 illustrates, in block diagram form, the construction of explosivedetection system 110. Explosive detection system 110 includes athree-dimensional imaging system 210 and an angular analysis system 220.In this embodiment, three-dimensional imaging system 210 acts as a level1 scanner to make an initial determination whether an item underinspection contains any suspicious regions. Angular analysis system 220serves as a second level inspection system and determines properties ofmaterials in each suspicious region. Information on the materials in thesuspicious regions allows a more accurate indication of whether eachsuspicious region is either an explosive or an innocuous item.

In the embodiment shown, three-dimensional imaging system 210 andangular analysis system 220 are interconnected by a conveyor system.Here the conveyor system is shown to contain conveyors 242, 244, 246,and 248. If, upon initial inspection, three-dimensional imaging system210 detects no suspicious regions within an item under inspection, theitem under inspection is diverted to conveyor 242, causing the itemunder inspection to be “cleared.” In the example of an explosivedetection system used for an airport security system, cleared items maybe loaded onto airplanes, returned to passengers for carry-on to anairplane or otherwise allowed to enter a secured area.

Alternatively, if three-dimensional imaging system 210 identifies one ormore suspicious regions in an item under inspection, the item underinspection is diverted to conveyor 244. Conveyor 244 carries the itemunder inspection to angular analysis system 220 for a level 2inspection.

As shown, three-dimensional imaging system 210 and angular analysissystem 220 are both coupled to controller 230. Controller 230 provides amechanism for information concerning an item under inspection to bepassed from three-dimensional imaging system 210 to angular analysissystem 220. Information passed from three-dimensional imaging system 210to angular analysis system 220 may include the number and locations ofsuspicious regions identified by three-dimensional imaging system 210.Further, the information may include a preliminary indication of thetype of threat object suspected or other information indicating why aregion was indicated as a suspicious region by three-dimensional imagingsystem 210.

Angular analysis system 220 uses the information generated bythree-dimensional imaging system 210 to identify locations within anitem under inspection at which material properties should be measured.In the pictured embodiment, angular analysis system 220 makesmeasurements that reveal information on the properties of materialswithin the suspicious regions of the item under inspection. Explosivedetection system 110 may then use this information to determine whethereach suspicious region contains an explosive or other threat item orwhether it contains an innocuous item. Such a determination may be madeby a processor or other computer hardware within angular analysis system220 that is suitably programmed. However, such processing may beperformed in any suitable processor.

In the example described herein, angular analysis system 220 uses x-raydiffraction analysis to measure properties of the material in eachsuspicious region. Briefly, x-ray diffraction systems operate on theprincipal that x-rays are diffracted, or scattered, from a material atan angle that is related to the properties of that material. Morespecifically, x-rays are diffracted at an angle related to the energy ofthe x-ray and the spacing between the molecules in the material fromwhich they are diffracted. Accordingly, the spectrum of x-raysdiffracted at a particular angle from an object provides informationabout the type of material in that object. By matching the spectrum ofscattered x-rays to a spectrum of a known explosive material or to aspectrum of a know innocuous material, angular analysis system 220 mayprovide information allowing a suspicious region identified bythree-dimensional imaging system to be classified with higher confidenceas a threat or as an innocuous item.

X-ray diffraction is described in the literature, including U.S. Pat.No. 6,118,850 to Mayo et al. entitled “Analysis Methods for EnergyDispersive X-ray Diffraction Patterns,” issued Sep. 12, 2000, which ishereby incorporated by reference in its entirety. Angular analysissystem 220 may perform analysis as described in that patent or in anyother suitable way.

However, X-ray diffraction is not the only possible type of angularanalysis. Some materials fluoresce when irradiated, which generatesradiation with a spectrum characteristic of the material. By capturingradiation emitted at a particular angle, it may be possible toselectively receive radiation emitted from a suspicious region of anitem under inspection. Analysis of the spectrum of the capturedradiation may indicate the nature of the material in that suspiciousregion.

Regardless of the exact principle of operation of angular analysissystem 220, the system includes a focusing system that allows radiationfrom a region of an item under inspection to be captured and analyzed.In operation, angular analysis system 220 is focused on one or morelocations within each suspicious region identified by three-dimensionalimaging system 210. Radiation emanating from these regions is capturedand analyzed. Information obtained by this analysis is used to determinewhether each suspicious region contains only innocuous material orcontains material characteristic of a threat.

An item under inspection for which all suspicious regions are determinedto contain only innocuous material is diverted onto conveyor 246. Itemsdiverted onto conveyor 246 are thereafter process as cleared items.Conversely, if information generated by angular analysis system 220indicates that one or more of the suspicious regions contains anexplosive or other threat item, the item under inspection is alarmed.The alarmed item may be diverted onto conveyor 248, where the item underinspection is processed in the manner appropriate for an item containingan explosive or other contraband item. For example, alarmed items may befurther inspected, including by a manual search, or may be destroyed orotherwise precluded from entering a secured area.

In the example of FIG. 2, three-dimensional imaging system 210 andangular analysis system 220 are shown as independent systems withcontroller 230 passing information between them to allow the overallsystem to make a determination about each item under inspection. Such anarchitecture is just one example of an architecture for explosivedetection system 110. Acquisition of data and analysis of that data maybe performed in any suitable hardware. For example, all data analysiscould be performed in controller 230. In such embodiments,three-dimensional imaging system 210 may acquire data on an item underinspection and provide that data to controller 230. Controller 230 mayanalyze the data acquired by three-dimensional imaging system 210 todetect suspicious regions. Similarly, angular analysis system 220 maymeasure the spectrum of scattered radiation from an item underinspection and provide data describing the measured spectrum tocontroller 230. Controller 230 may thereafter analyze the measurementsto determine whether an item under inspection should be processed as analarmed item or processed as a cleared item.

Though, this is only an example of one partitioning of the data analysisand processing functions and other embodiments are possible. Forexample, three-dimensional imaging system 210 and angular analysissystem 220 may be housed within the same physical unit or may be housedin separate physical units. They may be located relatively closetogether or maybe located in different physical locations andinterconnected through a computer network or other communication medium.

In embodiments in which three-dimensional imaging system 210 and angularanalysis system 220 are separate units linked by a conveyor system, itmay be necessary to relate the coordinate system in which angularanalysis system 220 measures properties of suspicious region to thecoordinate system in which three-dimensional imaging system reportssuspicious regions. In the pictured embodiment, becausethree-dimensional imaging system 210 and angular analysis system 220 arein separate locations, it is possible for an item under inspection toshift its position on the conveyor system as the item is moved fromthree-dimensional imaging system 210 to angular analysis system 220.Accordingly, angular analysis system 220 may be adapted to contain asystem to register its coordinate system to that used bythree-dimensional imaging system 210. An example of a suitable system isdescribed in co-pending patent application Ser. No. 11/400,489, entitled“REGISTRATION SCHEME IN EXPLOSIVES DETECTION SYSTEM,” and filed on Apr.7, 2006, which is hereby incorporated in its entirety. However, anysuitable mechanism to relate the coordinate systems may be used.

In operation, explosive detection system 110 may inspect a series ofitems. These items may be moved through three-dimensional imaging system210 at a constant rate. Some portion of the items inspected atthree-dimensional imaging system 210 may be cleared during first levelinspection and then diverted on conveyor 242. However, the remainder ofthe series of items under inspection may be diverted on conveyor 244 forfurther analysis by angular analysis system 220. To provide highthroughput for explosive detection system 110, angular analysis system220 may process the items diverted on conveyor 244 at the same rate atwhich those items are processed by three-dimensional imaging system 210.Further, in some embodiments, angular analysis system 220 will performmeasurements on items under inspection without stopping them as theymove on conveyor 244. By avoiding the need to stop items within angularanalysis system 220, the overall throughput of explosive detectionsystem 110 may be increased. Accordingly, as described in more detailbelow, some embodiments of the invention provide an angular analysissystem 220 that may perform measurements on items under inspection asthey are moving on conveyor 244 through the angular analysis system 220.

In the embodiment of FIG. 2, three-dimensional imaging system 210 actsas a level 1 scanner. Explosive detection systems with level 1 scannersare known. Any suitable level 1 scanner may be used in explosivedetection system 110. However, in this example, three-dimensionalimaging system 210 is a helical scan CT system.

FIG. 3 illustrates a helical scan CT system that may be used as a level1 scanner in explosive detection system 110. As shown in FIG. 3, itemsunder inspection, such as item 382, move continuously along a conveyor112. As item under inspection 382 passes through three-dimensionalimaging system 210, an x-ray source 314 and x-ray detector array 316rotate around conveyor 112. Though the source 314 and detector array 316rotate in a stationary plane perpendicular to conveyor 112, because itemunder inspection 382 is moving along conveyor 112, the source anddetector array trace out a helical path 330 relative to item underinspection 382.

In the illustrated embodiment, x-ray source 314 and detector array 316combine to measure the x-ray power passing through item under inspection382. Such a measurement indicates the amounts various portions of theitem under inspection 382 attenuated the x-rays. These attenuationmeasurements may be used as an indication of the density of regions ofthe item under inspection. In the system as shown, attenuation isdetermined for x-rays at a single energy level and suspicious regionsare identified based on the shape and density of the region.

However, materials of different atomic number attenuate x-rays ofdifferent energies differently. Some x-ray imaging systems makemulti-energy x-ray measurements to obtain information about the atomicnumber of the materials in the item under inspection. Thus, in someembodiments, three-dimensional imaging system 210 may identifysuspicious regions in part based on their atomic number.

Regardless of whether single or multi-energy measurements are made, asin a conventional helical scan system, source 314 may have a beam angleα designed to intersect the entire width W of detector array 316. Thespeed of rotation of the source 314 and detector array 316 may becontrolled relative to the speed of conveyor 112 such that the spacing Dbetween loops of helical path 330 is sufficiently small that adequatedata is collected on item under inspection 382 to allow computedtomographic reconstruction techniques to be used to form athree-dimensional image of item under inspection 382. With thisconfiguration, an image of each item under inspection may be generatedwithin three-dimensional imaging system 210 as items under inspectionpass in a continuous stream along conveyor 112.

In the embodiment of FIG. 3, an image formed by three-dimensionalimaging system 210 is illustrated graphically as image 370. Image 370appears as it may be presented on a computer screen to an operator ofthree-dimensional imaging system 210. In some embodiments, the imageformed by three-dimensional imaging system 210 may be presentedgraphically to a human operator who may then select suspicious regionsfor further analysis. However, in other embodiments, the image may beprocessed by a computer system without intervention of a human operator.Data analysis techniques to automatically recognize suspicious regionsfrom measurements made with a three-dimensional imaging system areknown. Such techniques, or any other suitable technique, may be used toidentify suspicious regions within item under inspection 382.

Those items under inspection containing suspicious regions are divertedto angular analysis system 220 (FIG. 2). Angular analysis system may beoperated to focus on the suspicious regions to better identify whetherthey contain threat items or innocuous items. FIG. 4 illustrates detailsof a focusing system of angular analysis system 220 according to anembodiment of the invention.

In this embodiment, conveyor 244 moves an item under inspection 180 intoan inspection region 400. Angular analysis system 220 is focused on oneor more points within each suspicious region 182 identified as a resultof level 1 scanning. As used herein, “focusing” means that the system isconfigured to receive radiation emanating from a selected region. In theconfiguration shown in FIG. 4, angular analysis system 220 is focused onfocus region 454.

To gather information on suspicious region 182, item under inspection ismoved on conveyor 244 into inspection region 400. Angular analysissystem 220 is then adjusted to focus on a location within suspiciousregion 182 and radiation emanating from that location is gathered andanalyzed. If information on other locations within suspicious region 182is desired, the system is refocused and more data is collected. In someembodiments, two measurements are taken on each suspicious region, butany number of measurements may be taken. Once data is collected for onesuspicious region, the system may be refocused on other suspiciousregions.

In the pictured embodiment, angular analysis system 220 is an x-raydiffraction system. For an x-ray diffraction system, data is collectedby radiating an item under inspection with x-rays. In the embodiment ofFIG. 4, item under inspection 180 is radiated with pencil beam 450 ofx-ray radiation. Pencil beam 450 is generated by an x-ray source. As canbe seen in FIG. 4, pencil beam 450 passes through focus region 454.

In the illustrated embodiment, angular analysis system 220 includes asource assembly 410 that generates pencil beam 450. Source assembly 410includes an x-ray tube 412.

X-ray tube 412 is powered by high voltage power supply 460. In someembodiments, high voltage power supply 460 is selected to power x-raysource 412 to emit radiation at a range of energies. The upper limit ofthat range is set by the voltage of high voltage power supply 460. Insome embodiments, high voltage power supply 460 has an upper range ofabout 130 keV. In one embodiment, high voltage power supply 460 has avoltage of approximately 100 keV. A maximum supply of voltage of about100 keV or less has been found to provide adequate energy that detector432 may make a measurement without introducing an unreasonable amount ofnoise that interferes with measurements.

In the illustrated embodiment, power supply 460 is not mounted to sourceassembly 410. It supplies power to x-ray tube 412 through flexible cable462 that allows source assembly 410 to move relative to power supply460. Such a configuration allows power supply to be mounted in anysuitable location and may be separated from the remainder of the systemby distance, shielding or in any other suitable way.

Radiation leaving x-ray tube 412 is collimated into a pencil beam bycollimator 414. Collimator 414 may be a material opaque to x-rays, suchas titanium, having a small aperture, such as a pinhole. Collimator 414is held by support member 418, which may be coupled to x-ray tube 412.In this embodiment, collimator 414 has a fixed position relative tox-ray tube 412 such that source assembly 410 emits pencil beam 450perpendicular to conveyor 244. As shown, source assembly 410 may move inthe directions labeled X or Z to position the source assembly 410 sothat pencil beam 450 passes through any desired focus region. Toposition beam 450, source assembly 410 is coupled to drive mechanism420. In operation, drive mechanism 420 is controlled, such as bycommands sent from controller 230, to position pencil beam 450 such thatit passes through a suspicious region 182 within item under inspection180. Drive mechanism 420 may be any suitable drive mechanism, includingan electric linear motor, an electric rotating motor or a hydraulicactuator.

In this embodiment, drive mechanism 420 is shown coupled to track 422that guides drive mechanism 420 in the Z direction. A similar track (notshown) may be included to guide drive mechanism 420 as it moves in the Xdirection. However, any suitable mechanical support structure may beused to movably retain source assembly 410. In the illustratedembodiment, drive mechanism 420 may position source assembly 410 at anydesired position in the X-Z plane below inspection area 400.

In the example of FIG. 4 in which angular analysis system 220 is anx-ray diffraction system, measurements are made by collecting radiationdiffracted at a specific angle relative to pencil beam 450. In theconfiguration illustrated in FIG. 4, diffracted radiation 452 emanatingfrom focus region 454 is measured and analyzed.

Information is gathered on the material within focus region 454 usingdetector assembly 430. Detector assembly 430 includes a detector 432. Inthis embodiment, detector 432 may be a high performance germaniumdetector. Detector 432 may be chilled to increase its sensitivity. Insome embodiments, a range of measurements may be made using a singledetector. However, any suitable detector or detectors may be used.

The output of detector 432 may be coupled to controller 230 (FIG. 2) orother suitable data processing device. This output may be processedusing x-ray diffraction techniques as described above and as describedin more detail below to identify the type of material within suspiciousregion 182.

As shown in FIG. 4, detector 432 is positioned to receive radiation 452emanating from focus region 454. Radiation 454 reaches detector 432because it is emanating from focus region 454 at an angle that allows itto pass through both aperture plates 434 and 436. As shown, apertureplates 434 and 436 have relatively narrow apertures and are held apartby support member 438 at a sufficient distance that only radiationtraveling in a relatively small range of angles can pass throughaperture plates 434 and 436. Detector assembly 430 contains shielding439 that blocks radiation from reaching detector 432 other than throughaperture plates 434 and 436.

The size, shape and relative position of aperture plates 434 and 436define a field of view for detector 432. The intersection of this fieldof view for detector 432 with pencil beam 450 defines a focus region 454on which a measurement is taken. By controlling the position of detectorassembly 430 relative to source assembly 410, the point at which thisfield of view intersects pencil beam 450 can be controlled, therebycontrolling the location of focus region 454.

Accordingly, detector assembly 430 is coupled to a drive mechanism 440,which allows it to be positioned to achieve the desired focus. Drivemechanism 440 may be mounted on track 442 or mounted in any othersuitable way that allows detector assembly 430 to be positioned so thatangular analysis system 220 images the desired focus region.

In the pictured embodiment, controller 230 (FIG. 2) provides commands todrive mechanism 420 and drive mechanism 440 to position source assembly410 and detector assembly 430 such that focus region 454 coincides witha suspicious region 182. If multiple measurements are desired within onesuspicious region, information may be acquired from detector 432 withthe source assembly 410 and detector assembly 430 positioned to focus atthe desired location within suspicious region 182. Thereafter, either orboth of source assembly 410 and detector assembly 430 may berepositioned to focus angular analysis system 220 on a differentlocation within suspicious region 182.

In some embodiments, a single measurement may be made for eachsuspicious region 182. In other embodiments, controller 230 may controlangular analysis system 220 to take a second measurement withinsuspicious region 182. Any number of measurements may be taken within asuspicious region.

Regardless of the number of measurements taken on each suspiciousregion, if an item under inspection 180 contains multiple suspiciousregions, controller 230 (FIG. 2) may control drive mechanisms 420 and440 to sequentially position source assembly 410 and detector assembly430 to focus on each suspicious region.

In some embodiments, diffracted x-rays will have sufficiently low fluxthat data must be captured over a finite data capture period in order tocapture enough x-ray photons for reliable analysis. If conveyor 244 ismoving an item under inspection relative to source assembly 410 anddetector assembly 430 during this data capture period, the system willbe focused on different regions of the item under inspection at thestart and end of the data capture period. Capturing data in this fashionmay not be sufficiently accurate for some applications. Therefore, insome embodiments, controller 230 may generate commands to the conveyorsystem to stop conveyor 244 while data is being captured on one regionof an item under inspection.

Even if conveyor 244 is stopped for a measurement, it is not necessaryin all embodiments that source assembly 410 and detector assembly 430 beheld stationary. For example, while detector 432 is capturing data, insome embodiments source assembly 410 and detector assembly 430 may moveslightly relative to item under inspection 180. Such slight motion,sometimes called “dither,” may average out measurement noise andincrease the accuracy with which measurements are made.

Further, whether or not dither is employed in a measurement, it is notnecessary that item under inspection be held stationary while data isbeing acquired. In some embodiments, conveyor 244 may move item underinspection 180 through inspection region 400 while measurements arebeing made on item under inspection 180. Because both source assembly410 and detector assembly 430 may move in the Z direction, sourceassembly 410 and detector assembly 430 may move in synchronization withitem under inspection 180. In this way, the relative position of itemunder inspection 180 to source assembly 410 and detector assembly 430may be maintained while a measurement is being made even though itemunder inspection 180 moves.

If the speed of conveyor 244 is such that an item under inspection doesnot pass through inspection area 400 faster than the time required totake measurements on the suspicious regions in the item underinspection, conveyor 244 does not have to be stopped. By takingmeasurements without stopping conveyor 244, no time is lost starting andstopping conveyor 244. Furthermore, by continuously inspecting items inangular analysis system 220 at the rate at which they are processed inthree-dimensional inspection system 210, items under inspection may flowcontinuously from the level 1 scanner, which increases the overallthroughput of explosive detection system 110.

With the embodiment of FIG. 4, the full range of measurements that canbe made on item under inspection 180 while stopped can also be made asit moves through inspection region 400. For example, to repositionsource assembly 410 and detector assembly 430 for measurements on asecond suspicious region, one or both of the source assembly 410 anddetector assembly 430 may be moved at a rate different than the itemunder inspection to focus angular analysis system 220 on the desiredlocation within item under inspection 180. Likewise, to collect datawhile dithering the source and detector, the source and detector can besynchronized to, on average, move at the same speed as conveyor 244, butto have an instantaneous speed at any given time that is slightly aboveor slightly below the speed of conveyor 244.

FIG. 5 shows in greater detail how the relative positioning of sourceassembly 410 and detector assembly 430 may be used to focus angularinspection system 220 on the specific focus region 454 and toselectively process radiation emanating at a defined angle. In thepictured embodiment, angular analysis system 220 may be focused in threedimensions and select an examination angle with only movement in twodimensions. Those two dimensions are parallel to conveyor 244, whichallows for a compact system.

FIG. 5 shows the system in cross section as seen in the Y-Z plane. Asdescribed above in connection with FIG. 4, the source and the detectorcan be positioned independently within the X-Z plane. Focus region 454may be positioned at any point in the X-Z plane by positioning source412 below the desired location. In the illustrated embodiment, detector432 is positioned at the same X location as source 412. Then, detector432 is positioned in the Z direction so that radiation 452, diffractedat a desired angle, Θ, from focus region 454 passes through the apertureplates 434 and 436.

Once this relationship between source 412 and detector 432 is set, focusregion 454 can be translated to any location in the X-Z plane bytranslation of source 412 and the detector 432 in unison. As the sourceand the detector move together, focus region 454 will move acorresponding amount.

In the embodiment illustrated, the relative Y position of focus region454 may be controlled by differential movement of source 412 and thedetector 432. As shown in FIG. 5, focus region 454 is at a distance H inthe Y direction below detector 432. The magnitude of H is related to therelative displacement in the Z direction of detector 432 from source412. This relative displacement is indicated as S₁. By increasing S₁,the magnitude of H will increase, lowering focus region 454. Conversely,decreasing S₁ will raise focus region 454. Drive mechanisms 420 and 440can be controlled to position source 412 and detector 432 to increase ordecrease S₁ and position focus region 454 as desired.

Furthermore, the focusing system of angular inspection system 220 alsomay be constructed to allow the angle E to be simply controlled. Asshown in FIG. 5, the angle Θ is controlled by the distance S₂ separatingapertures 530 and 532. Increasing S₂ causes an increase in the angle Θ.Conversely, decreasing S₂ causes a decrease in the angle Θ.

By coupling aperture plate 434 to a drive mechanism 520, the angle Θ maybe varied automatically, such as under control of a software program oncontroller 230. As will be described below in conjunction with FIGS. 7Aand 7B, it may be desirable to make measurements on the same region ofan item under inspection at different angles or to set the angledynamically based on information about an item under inspection.

Drive mechanism 520 may be used to alter the spacing S₂ in any suitableway. Aperture plate could be moved in the Z direction to directly varythe distance S₂.

However, in some embodiments, drive mechanism 520 may move apertureplate 434 in the X direction. In such embodiments, aperture plate 434may contain multiple apertures, located at different Z distances fromthe edge of the plate. Moving aperture plate 434 in the X direction mayexpose a different aperture through opening 550 in support member 438,thereby changing S₂. Translation in the X direction to vary theproperties of the aperture in this fashion may also allow properties ofthe aperture other than its Z position to be easily controlled, asdescribed below in conjunction with FIGS. 6A and 6B.

In the illustrated embodiment, the source and detector have independentpositioning systems, allowing both the relative X and Z position of thesource and detector to be controlled. However, in some embodiments,source 412 and detector 432 are controlled so that they have the same Xposition. In such embodiments, it is not necessary for the source anddetector to have completely independent positioning systems. Simplifiedoperation or construction may be possible by having the X positioningsystems of the source and detector electrically or mechanically coupledso that the source and detector move together in the X direction.

Regardless of whether a simplified positioning system is used, angularanalysis system 220 has a compact focusing system, allowing the overallsystem to be small and relatively low cost. The focusing system cancontrol the coordinates of the focus region in X, Y, Z and Θ using onlymotion in the X-Z plane. Further, the focusing system does not requirecomponents that extend significantly further in the X-direction orY-direction than inspection region 400 (FIG. 4). Moreover, it does notrequire space above or below inspection region 400.

Such a focusing system compares favorably to systems using a C-arm tocouple the source assembly and detector assembly. Systems with C-armsneed to provide additional clearance above, below and on the side of theinspection region to accommodate the C-arm in any focus position.

Turning to FIGS. 6A and 6B, additional details of aperture plate 434 maybe seen. Aperture plate 434 may be constructed from a material thatblocks radiation from reaching detector 432 (FIG. 4) except thatradiation passing through an aperture in aperture plate 434.

In the embodiment of FIGS. 6A and 6B, aperture plate 434 containsmultiple apertures. Here, apertures 530 and 630 are shown for use inacquiring radiation from specified angles. As described above, motion ofaperture plate 434 in the X direction positions one of the apertures inthe aperture plate 434 within opening 550. The aperture on apertureplate 434 positioned within opening 550 (FIG. 5) dictatescharacteristics of radiation reaching the detector 432. For example,apertures 530 and 630 have different positions in the Z direction, butotherwise have similar characteristics. In this embodiment, aperture 630is positioned in the Z direction to allow radiation at an angle of 3.2°to reach detector 432. Conversely, aperture 530 is positioned in the Zdirection to allow radiation at an angle of 5° to reach detector 432.

In some embodiments, apertures with different shapes or othercharacteristics may be included on aperture plate 434. However, in thisembodiment, apertures 530 and 630 are both shown as slits elongated inthe X direction. The slits are narrow in the Z direction. In anembodiment such as is shown in FIG. 5 in which the detector 432 isoffset from source 412 in the Z direction, an aperture that is narrow inthe Z direction provides good angular resolution. Good angularresolution, in this context, indicates that radiation diffracted at arelatively narrow range of angles is allowed to reach detector 432. Goodangular resolution is desirable in some embodiments because the spectrumof diffracted radiation is dependent on the angle at which the radiationis measured. If radiation diffracted at multiple angles simultaneouslyreaches detector 432, multiple spectra may be superimposed in themeasured radiation and it may become difficult to detect a singlespectrum associated with a specific type of material within focus region454.

However, providing a narrow aperture restricts the X-ray photon flux atdetector 432. For detector 432 to make an accurate measurement, it mustcapture a sufficient number of X-ray photons. By reducing the X-rayphoton flux, the data capture time may need to be increased, which mayalso be undesirable in some embodiments. However, to offset a decreasein X-ray photon flux by making aperture 530 and 630 narrow in the Zdirection, apertures 530 and 630 may be elongated in the X-direction.Though elongating apertures 530 and 630 in the X direction decreases thespatial resolution with which focus region 454 may be specified, theinventors have appreciated that an explosive detection system 110 isless sensitive to a decrease in spatial resolution than to a decrease inangular resolution. Accordingly, in some embodiments, a slit-shapedaperture provides a desirable compromise between resolution and dataacquisition time.

Nonetheless, it should be appreciated that the slit-shaped apertures asshown for apertures 530 and 630 are representative of the shapes thatmay be used to form apertures in plates 434. For example, apertures 530and 630 may be shaped as ovals, circles or in any other suitable shapes.

Aperture plate 434 may also include apertures with characteristics thataffect operating parameters of angular analysis system 220 other thanthe angle of radiation allowed to reach detector 432. For example,aperture plate 434 may be constructed with an aperture to hold acalibration disk 634. Calibration disk 634 may be a printed circuitboard or other substrate coated with materials that emit radiation atspecific energies when radiated by X-ray energy of the type emitted bysource 412. Materials having these properties are known in the art, andany suitable materials may be used to construct calibration disk 634.

When calibration disk 634 is incorporated into aperture plate 434, itprovides an easy mechanism for calibration of detector 432. Apertureplate 434 may be moved to position calibration disk 634 in opening 550(FIG. 5). Calibration disk 634 may then be irradiated by beam 450.Because radiation emitted by calibration disk 634 has a known energyspectrum, the output of detector 432 in response to energy of this knownspectrum may be used to calibrate detector 432.

As another example of the type of aperture that may be included onaperture plate 434, pin hole 632 is shown. Aperture plate 434 may bemoved to position pin hole 632 within opening 550. Pin hole 632 may havea Z position in aperture plate 434 such that when it is positioned inopening 550, it will be aligned with aperture 532 (FIG. 5). With thisalignment, radiation of X-ray source 412 will reach detector 432 only ifsource 412 and detector 432 are aligned in the X-Z plane. Accordingly,pin hole aperture 632 may be used to align source 412 and detector 432.Alternatively, pin hole aperture 632 may be used to measure the strengthof radiation passing through an item under inspection without beingscattered. Being able to measure the strength of radiation passingthrough an item under inspection in this way may provide additionalinformation for analyzing a suspicious region.

To avoid saturating detector 432 for straight-through measurements, pinhole 632 may be laser drilled or otherwise made very small. If thematerial from which aperture plate 434 is constructed is to brittle toallow a sufficiently small pin hole to be formed, pin hole 632 may beprovided with a small diameter by inserting a plug of a softer material,such as gold or lead, in which a small pin hole may be formed.

Turning to FIGS. 7A and 7B, an example of the benefit of being able toautomatically alter the properties of the aperture controlling radiationreaching detector 432 is provided. FIGS. 7A and 7B illustrate energyspectra from the same object but taken at different angles. The energyspectra of FIG. 7A was measured at an angle of 3.2° and, for example,may correspond to measurements made using aperture 630. FIG. 7B isrepresentative of an energy spectrum taken at an angle of 5° and, forexample, may represent a measurement taken with aperture 530.

In FIG. 7B, four readily identifiable peaks in the spectrum are visible.The peaks are labeled A, B, C and W. In this example, the peak labeled Wrepresents energy from X-ray source 410 that is not diffracted.Accordingly, the peak labeled W appears at approximately 60 keV in bothof the spectra of FIGS. 7A and of 7B. The other peaks, labeled A, B andC appear at energies that are dependent on the measurement angle becausethey have been diffracted. These peaks may provide a signaturecharacteristic of a specific material of interest.

As shown in FIG. 7A, when the measurement is made at 3.2°, it isdifficult to recognize the signature of that material. The peakidentified as A is indistinguishable from the peak identified as W.Also, the peak identified as C is small and largely indistinguishablefrom noise associated with the measurement. Though the peak identifiedas B is readily observable, identifying a single peak in the spectrummay not provide accurate recognition of the material. In contrast, FIG.7B shows that when X-rays scattered at an angle of 5° are measured forthis material, three readily recognizable peaks identified as A, B and Cappear in the spectrum. The peak A is separated in energy form the peakW in the spectrum of FIG. 7B and is therefore more readily recognizablethan in FIG. 7A. Also, the peak identified as C is larger in comparisonto the noise and also more readily identified.

Comparison of FIGS. 7A and 7B demonstrates that in some scenarios somemeasurement angles will be more suited for identifying a specificmaterial than others. Appreciation of the phenomenon that differentmaterials will be easier to recognize for measurements taken atdifferent angles in combination with the ease of automatically alteringthe measurement angles provides by the system of FIGS. 4 and 5 givesrise to a novel process for operating an explosive detection system,such as explosive detection system 110 (FIG. 1). The process isillustrated by FIG. 8.

The process of FIG. 8 begins at block 810 where coordinates ofsuspicious regions are generated. In explosive detection system 110,coordinates of suspicious regions may be generated by three-dimensionalimaging system 210. However, the suspicious regions may be identified inany suitable way.

The coordinates generated at block 810 are used in sub-process 811during which an angular analysis system is focused to measure a propertyof the material within a suspicious region. In the example in which theprocess of FIG. 8 is performed in explosive detection system 110,sub-process 811 is performed by providing coordinates of regions withinthe suspicious regions at which X-ray diffraction measurements are made.

At block 812 an X-ray source is positioned below the specific region inwhich material properties are to be measured.

The process continues to block 814 where a measurement angle isselected. Any suitable approach may be used to select a measurementangle. In situations where level one scanning provides informationindicating the nature of the material in the suspicious region, such asfor example if dual energy measurements indicate an atomic number,information may be available indicating the measurement angle mostlikely to produce a readily recognizable spectrum if the suspectedmaterial is present. In other embodiments, or when material informationis not available, a measurement angle may initially be selected bydefault.

In setting the measurement angle at block 814, it is not necessary thatthe measurement be intended to identify a threat material. For example,when level 1 scanning indicates a suspicious region because the level 1system can not reliably determine whether the region contains aninnocuous plastic case or a plastic explosive, the measurement angle maybe set to capture a spectrum in which the explosive may be readilyrecognized or, the measurement angle may be set to capture a spectrum inwhich the innocuous plastic case may be readily identified. Determiningthat either the suspicious region contains a threat material or aninnocuous material may allow a more accurate determination of whetherthe item under inspection should be alarmed.

Once the measurement angle is selected, the process continues to block816. At block 816, the components of the focusing system of angularanalysis system 220 are positioned to provide the desired focus inheight and angle. As shown in FIG. 5, drive mechanism 520 may positionaperture 530 to control the measurement angle. Drive mechanism 440 mayposition the detector assembly to focus angular analysis system 220 on afocus region 454 at the desired height.

The process then proceeds to block 818 where radiation scattered fromthe focus region is captured. The processing at block 818 may last untila sufficient number of scattered X-ray photons are captured to provide areliable measurement. As described above, the processing at block 818may be performed while conveyor 244 is stationary or may be performedwhile the source and detector assembly are moving with the motionsynchronized to the motion of conveyor 244.

Once sufficient radiation is captured, the process continues to block820 where the spectrum of the captured radiation is analyzed. As shownin connection with FIGS. 7A and 7B, spectrum analysis performed at block820 may involve matching peaks in the radiation spectrum to patterns ofpeaks associated with previously-identified material. If a sufficientlyhigh correlation between the peaks of the captured radiation spectrumand the radiation spectrum of a known material is achieved, the materialin the focus region is identified. If the material in the focus regionis identified, when processing reaches decision block 822, the alarm maybe resolved. The alarm may be resolved by identifying either that allsuspicious regions in the item under inspection contain only innocuousmaterials or that at least one of the suspicious regions contains athreat material. If either of these resolutions is achieved, processingcontinues to block 824 where the result is reported. The processing atblock 824 may include notifying a human operator that a threat has beendetected, diverting the item under inspection for further processing asa cleared or alarmed item, as appropriate, or taking any other suitableaction.

Conversely, if processing at block 820 does not result in informationthat allows the alarm to be resolved, processing continues to block 826.For example, the radiation captured at block 818 may not have a spectrumwith distinctive peaks that could be matched to stored spectra. At block826, different values of S₁ and S₂ may be set. By setting differentvalues of S₁ and S₂, radiation may be captured at a different angle, butin the pictured embodiment radiation is captured from the same focusregion as at block 818.

With these new settings for S₁ and S₂, processing proceeds to block 828.At block 282, radiation is again captured. The spectrum of thisradiation is analyzed at block 830. The processing at blocks 828 and 830may be similar to that performed at blocks 818 and 820. However, thespectra of known material compared to the radiation captured at block830 are spectra of radiation captured at the same measurement angle thatwas set at block 826. Even if analysis at block 820 did not resolve thealarm, processing at block 830 may resolve the alarm if the measurementangle set at block 826 results in a radiation spectrum with a morerecognizable pattern of peaks or other features.

The results of the analysis performed at block 830 are reported at block832. The processing of block 832 may be similar to the processingperformed at block 824. However, if no resolution of the alarm waspossible based on the analysis performed at block 830, the item underinspection may be passed on to a higher level inspection with anindication that the alarm was not resolved.

The processing pictured in FIG. 8 is one example of a process that maybe performed with an explosive detection system such as explosivedetection system 110. Though processing is illustrated as occurring insequential process blocks, any suitable ordering of the process blocksmay be used, including concurrent execution of one or more processblocks. Also, FIG. 8 presents a greatly simplified illustration ofpossible processing. For example, various process steps illustrated inFIG. 8 may be repeated to take multiple measurements on each suspiciousregion or to take measurements on multiple suspicious regions on an itemunder inspection.

Having thus described several aspects of at least one embodiment of thisinvention, it is to be appreciated various alterations, modifications,and improvements will readily occur to those skilled in the art.

The above-described embodiments of the present invention can beimplemented in any of numerous ways. For example, in the describedembodiment, the detector collimator included slits elongated in theX-direction and the source and detector were controlled to maintain thesame X position. The same results could be achieved by forming apertureselongated in the Y direction and controlling the source and detector tohave the same Y position. Thus, specific directions of motion are not alimitation on the invention.

Also, the embodiments may be implemented using hardware, software or acombination thereof. When implemented in software, the software code canbe executed on any suitable processor or collection of processors,whether provided in a single computer or distributed among multiplecomputers.

Also, the various methods or processes outlined herein may be coded assoftware that is executable on one or more processors that employ anyone of a variety of operating systems or platforms. Additionally, suchsoftware may be written using any of a number of suitable programminglanguages and/or conventional programming or scripting tools, and alsomay be compiled as executable machine language code or intermediate codethat is executed on a framework or virtual machine.

In this respect, the invention may be embodied as a computer readablemedium (or multiple computer readable media) (e.g., a computer memory,one or more floppy discs, compact discs, optical discs, magnetic tapes,etc.) encoded with one or more programs that, when executed on one ormore computers or other processors, perform methods that implement thevarious embodiments of the invention discussed above. The computerreadable medium or media can be transportable, such that the program orprograms stored thereon can be loaded onto one or more differentcomputers or other processors to implement various aspects of thepresent invention as discussed above.

The terms “program” or “software” are used herein in a generic sense torefer to any type of computer code or set of computer-executableinstructions that can be employed to program a computer or otherprocessor to implement various aspects of the present invention asdiscussed above. Additionally, it should be appreciated that accordingto one aspect of this embodiment, one or more computer programs thatwhen executed perform methods of the present invention need not resideon a single computer or processor, but may be distributed in a modularfashion amongst a number of different computers or processors toimplement various aspects of the present invention.

Computer-executable instructions may be in many forms, such as programmodules, executed by one or more computers or other devices. Generally,program modules include routines, programs, objects, components, datastructures, etc. that perform particular tasks or implement particularabstract data types. Typically the functionality of the program modulesmay be combined or distributed as desired in various embodiments.

Various aspects of the present invention may be used alone, incombination, or in a variety of arrangements not specifically discussedin the embodiments described in the foregoing and is therefore notlimited in its application to the details and arrangement of componentsset forth in the foregoing description or illustrated in the drawings.For example, aspects described in one embodiment may be combined in anymanner with aspects described in other embodiments.

Use of ordinal terms such as “first,” “second,” “third,” etc., in theclaims to modify a claim element does not by itself connote anypriority, precedence, or order of one claim element over another or thetemporal order in which acts of a method are performed, but are usedmerely as labels to distinguish one claim element having a certain namefrom another element having a same name (but for use of the ordinalterm) to distinguish the claim elements.

Also, the phraseology and terminology used herein is for the purpose ofdescription and should not be regarded as limiting. The use of“including,” “comprising,” or “having,” “containing,” “involving,” andvariations thereof herein, is meant to encompass the items listedthereafter and equivalents thereof as well as additional items.

1. An inspection system, comprising: a) a conveyor adapted to move itemsin a first direction; b) a source assembly comprising: i) an x-raysource adapted to irradiate an item on the conveyor; and ii) a sourcecollimator positioned between the x-ray source and the conveyor; c) afirst positioning mechanism adapted and arranged to move the sourceassembly in a second direction, transverse to the first direction; d) adetector assembly comprising: i) a detector; and ii) a detectorcollimator positioned between the detector and the conveyor; e) a secondpositioning mechanism adapted and arranged to move the detector assemblyin the second direction, the second positioning mechanism adapted andarranged to be controlled in at least one direction independently of thefirst positioning mechanism; and f) a controller adapted to control thefirst and second positioning mechanisms to independently position thesource and detector assemblies relative to the item to focus theinspection system on a region within the item on the conveyor and tomove the source and detector assemblies in the first direction insynchrony with the conveyor, thereby maintaining the focus on the regionas the item moves on the conveyor.
 2. The inspection system of claim 1,wherein the first positioning mechanism is adapted and arranged to movethe source in the first direction and the second positioning mechanismis adapted and arranged to the move the detector in the first direction.3. The inspection system of claim 1, wherein the source collimator isshaped to pass a beam of radiation and the detector collimator is shapedto receive scattered radiation diffracted from the item on the conveyorat a scattering angle relative to the beam of radiation, and wherein thedetector measures an energy spectrum of the scattered radiationdiffracted at the scattering angle.
 4. The inspection system of claim 3,wherein the controller is coupled to the detector collimator and adaptedto vary the scattering angle of scattered radiation received at thedetector.
 5. The inspection system of claim 1, wherein the detectorcollimator comprises a movable stage carrying a plate having a pluralityof apertures therein.
 6. The inspection system of claim 5, wherein theplurality of apertures comprises a pinhole, a slit and an aperturehaving an x-ray fluorescent member disposed therein.
 7. The inspectionsystem of claim 1, wherein the x-ray source has an energy below about120 keV.
 8. The inspection system of claim 1, wherein the firstpositioning mechanism is constrained to position the source assembly ina first plane parallel to the first direction and the second positioningmechanism is constrained to position the detector assembly in a secondplane parallel to the first plane.
 9. A method of operating aninspection system having: a) an inspection region adapted and arrangedto position an item under inspection in a plane; b) a source; and c) adetector; the method comprising: i. moving the source and the detectorparallel to the plane in synchrony with the item to create a focusregion in an item under inspection; ii. with the source, radiating aportion of the item under inspection, the portion including the focusregion; iii. with the detector, measuring radiation emanating at anangle from the focus region; and iv. analyzing the measured radiation.10. The method of claim 9, further comprising dithering the position ofthe source and detector while measuring radiation.
 11. The method ofclaim 9, further comprising aligning the detector relative to the sourceby measuring with the detector radiation passing through a pinholecollimator.
 12. The method of claim 9, wherein moving the source and thedetector comprises positioning the source and detector with a separationin a first direction.
 13. The method of claim 12, wherein measuringcomprises measuring radiation passing through a detector collimator, thedetector collimator comprising at least one aperture shaped as a slit,the slit having a narrow dimension in the first direction.
 14. A methodof operating an inspection system, the method comprising: a) moving anitem through an inspection area; and b) gathering data on a focus regionof the item using a source and a detector while moving the source andthe detector synchronously with the item.
 15. The method of claim 14,further comprising: c) moving the source and detector other thansynchronously with the item, whereby the source and detector are alignedwith a second focus region of the item; and d) subsequently gatheringdata on the second focus region of the item using the source anddetector while moving the source and the detector synchronously with theitem.
 16. The method of claim 14, wherein moving an item comprisesmoving the item through the inspection area in a first direction andmoving the source and detector other than synchronously with the itemcomprises moving the source and detector transverse to the firstdirection.
 17. The method of claim 15, wherein moving the source anddetector other than synchronously with the item comprises moving thesource and detector different amounts.
 18. The method of claim 14,wherein the inspection area is in a second inspection device and themethod further comprises, prior to moving the item through theinspection area in the second inspection device, identifying the focusregion in a first inspection device.
 19. The method of claim 18, whereinthe first inspection device and the second inspection device are coupledthrough a conveyor system and moving the item comprises moving the itemon the conveyor system through the first inspection device and thesecond inspection device without stopping.
 20. The method of claim 19,wherein the first inspection device inspects a series of items of whicha plurality of items are identified for further inspection in the seconddevice, items in the plurality are identified at a rate and the secondinspection device inspects items at the same rate or higher.
 21. Theinspection system of claim 1, wherein the controller is further adaptedto control the first and second positioning mechanisms to maintain arelative position of the item to the source assembly and the detectorassembly.
 22. The method of claim 9, wherein moving the source and thedetector parallel to the plane in synchrony with the item furthercomprises maintaining a relative position of the item to the source andthe detector.
 23. The method of claim 14, wherein gathering data on afocus region of the item using a source and a detector while moving thesource and the detector synchronously with the item further comprisesmaintaining a relative position of the item to the source and thedetector.